Posted by on October 19, 19102 at 07:46:28:
Ferlyn A. Galvez
AE 177 W. Buyagan, La Trinidad
Benguet Philippines 2601
(6374)4225023
ferlyn95630@yahoo.com
SUMMARY
Six years experience in flash memory devices on product quality and reliability with significant technical background on new product development and high volume manufacturing. Well versed with new product qualification, technology certification, silicon debug, process improvement, cost reduction, excursion management, yield improvement, failure analysis, customer support, project management. Enjoys fast pace environment, customer oriented, independent worker, team player.
· Failure Mode and Effect Analysis
· Design Of experiment
· Risk assessment
· Structured Problem Solving
· 8D
· Flash Advantest Tester
· MOSAID
· SPA
· Curve Tracer
· Liquid Crystal
· Emission Microscope
· Liquid Crystal
· SEM
· CSAM
WORK EXPERIENCE
Intel Technology Philippines Flash memory Division 1996-2002
1999- 2002 New Product Introduction PQRE
· Qualified new products to world-class high volume manufacturing on target schedule by performing timely silicon debug, failure analysis and upfront root cause fix.
· Designed qualification flow serving as the backbone for new product introduction by providing timely technical risk assessment and identifying the correct reliability stresses.
· Strategized certifying 0.13um flash process technology by partnering with design engineers in qualifiying the lead vehicle.
· Identified upfront screens and fixes during product qualification to come up with a high volume worthy product.
· Partnered with tape development , sort and design engineers during silicon debug to attain 98% yield upon product start up.
· Saved $10M in capital cost spending by starting up ZOBI(zero out burn-in) with the Stacked chip scale product by actively pursuing root cause screen on process related failures.
1997-1999 (2 YEARS) Manufacturing Prod QRE
· Developed BKMS (best known methodology) for manufacturing improvements by using production data and identifying opportunities for driving down cost while safeguarding quality and reliability .
· Drive for continuous improvements and reduction of DPM(defects per million) by providing timely failure analysis and pursuing root cause fix either at test , fab, sort or assembly.
· Actively safeguarding product quality and reliability in any changes in test programs and process shifts.
· Target resolution and ultimately works in prevention of excursions by providing high quality and value added technical risk assessments.
· Championed test time reduction by eliminating zero fallout tests by looking at production DPM(defect per million) data.
1996-1997 (1 YEAR) Sustaining Prod QRE
· Analyzed Return materials from the customers within target schedule.
· Established backbone of health monitors to ensure continuous product health for High volume manufacturing.
· Reduced TPT(Through put time) by 15% of customer returns by providing timely failure analysis for field returns.
· Decreased the number of DRB( Disposition Review Board) by establishing Response flow charts for common line fallouts.
· Driving for lowest cost without compromising quality and reiability.
· Improving Quality Operating Systems. Develop Best Known Methods and proliferates it across Virtual Factory Sites through the Copy Exactly(CE ) Methodology. This is done through data analysis and design of experiments.
· Continuously looking at product health indicators to identify opportunity for cost reduction and quality improvement.
Education
BS , Electronics and Communications Engineering
Saint Louis University
Baguio City, Philippines